Bundle the solutions you need into one product
Compose 8 solutions to match your process — and tune the models to your domain
8 solutions you can compose
From Virtual Fab to INFER and PRISM — we combine solutions to match your process and the problem you're solving.
Virtual Fab
Synthetic wafer data infrastructure for AI training. A 160M+ DB covers rare signatures and edge cases.
INFER
Multimodal agent-based root-cause diagnostics. Ranks candidates against a domain KB; engineers validate step by step.
PRISM
Real-time overlay & hotspot prediction. R² > 0.9 at 0.3 nm — about 3× RMSE improvement over LR / XGBoost.
Semi-Brain
Domain-knowledge-driven reasoning engine. Combines Causal-RAG and Domain-Embedding to surface process causal structure.
Business Intelligence Suite
Unified process & yield analytics, visualized at the unit of decision.
Sampling Optimizer
Rule-based seeding plus GA optimization — metrology sampling redesigned for minimum cost, maximum coverage.
Defect Model Simulator
Pre-validate and simulate defect models before HVM deployment to reduce rollout risk.
Semi-Vision
Inter-tool drift correction, automatic defect inspection and accelerated frame averaging — one AI engine aligns multi-tool measurements onto a single reference.
Example compositions
How solutions get bundled to match real process challenges and adoption stages.
Virtual Metrology
Predict measurement without measuring. Cover non-measured wafers across critical processes and reduce metrology load.
SMILE Lite- Virtual Fab
- PRISM
Root-Cause Analysis
From anomaly signal to root cause — narrow candidates through causal reasoning grounded in a domain knowledge base.
SMILE Pro- Virtual Fab
- Semi-Brain
- INFER
Source-Response Analysis
Track upstream sources alongside downstream responses to interpret process signal and response together.
SMILE Lite- Semi-Brain
Let's scope a custom PoC together.
We review your process characteristics, deployment scope, and data environment — then design how the solutions should be composed.