Production line
Where defect signals and lot data originate. Both engines watch in real time, and validated corrections return to the next lot.
Data, prediction, diagnosis — one stack
An AI solution built for the speed and precision of semiconductor manufacturing — predicting defect root cause in real time and stopping yield loss before it hits the line.
Two engines, learning the line and the data together.
PRISM and INFER read the production line in real time to predict and diagnose; validated outcomes flow back into Virtual Fab's data, sharpening every next cycle.
Production Prediction PRISM
Real-time overlay and hotspot prediction proposes corrections for the next lot.
Diagnosis INFER
Domain-grounded causal reasoning narrows root-cause candidates; engineers validate each step in the loop.
Foundation Virtual Fab
Synthetic data grounded in process, equipment and defect rules — filling out the training distribution for both engines.
Eight solutions.
AI engines
PRISM
A real-time prediction engine for process drift
- Real-time overlay and hotspot prediction
- Feed-forward control
- Low-latency inference in production
Learn moreINFER
A causal reasoning engine for root cause analysis
- Rank root causes by probability
- Causal inference grounded in domain knowledge
- AI suggests, engineer decides
Learn moreVirtual Fab
A synthetic data infrastructure for AI training
- Validated synthetic data generation
- Coverage of rare signatures
Learn moreSemi-Brain
A multimodal inference engine reasoning over charts, process context and a domain knowledge base
- Multimodal first-pass interpretation
- Conversational follow-ups along the thread
- Engineer-validated, then acted on
Learn moreSemi-Vision
An SEM measurement alignment engine
- Cross-Tool Measurement Alignment
- AI Defect Inspection & Classification
- Throughput Optimization
Learn more
Workbench modules
Business Intelligence Suite
A BI suite built on semiconductor-native visualizations and chained drill-downs
- Semiconductor-native chart library
- Selection chain across charts
- Bookmarkable dashboards and report export
Learn moreSampling Optimizer
Automating the trade-off between metrology throughput and model fidelity
- Generate die-grid layout cases
- Place overlay keys, preview per-model trends
- Model-driven optimization
- Wafer-wide die and shot review
Learn moreDefect Model Simulator
Train, manage and simulate overlay correction recipes in one workspace
- Physically meaningful multi-stage model training
- Recipe-driven correction simulation
- Recipe library management
Learn more
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