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SemiAI

DEC 31, 2025

Agent-based RCA in Manufacturing (KR)

10-2025-0216860 · KP25154

Inventors

Taekwon Jee, Jihoon Jung, Jeng-Hun Suh

Applicant

SemiAI, Co.,Ltd.

Official Title

METHOD FOR PERFORMING ROOT CAUSE ANALYSIS IN MANUFACTURING PROCESS BY USING AGENT BASED MULTI MODAL REASONING MODEL AND ROOT CAUSE ANALYSIS DEVICE USING THE SAME

Summary

This invention provides an optimized overlay sampling method that maintains high accuracy with fewer measurement points. It uses rule-based sampling as an initial seed, combines it with random sampling, and applies a genetic algorithm to find optimal sampling locations. The algorithm iteratively evaluates fitness and performs selection, crossover, and mutation, while allowing hierarchical sampling based on layer importance. This approach reduces measurement cost while preserving accuracy and improving convergence and practicality in semiconductor manufacturing.